Purpose and area of application

   The laboratory of physical and chemical methods of investigations of BSTU applies the following kinds of electronic microscopy to carry out research:

- Scanning Electron Microscope with Chemical Microanalysis;

- Scanning Electron Microscopy with Wave-Dispersion Chemical Analysis;

- Transmission Electron Microscopy and Electron Diffraction.

Scanning Electron Microscope with Chemical Microanalysis

Directions of research:
- Investigations of microstructure of the wide range of materials: metals, alloys, ceramics, semiconductive materials, polymers, synthetic products;
- Investigations of non-conductive materials and biological objects in low vacuum mode without conductivity layers;
- Qualitative and quantitative energy dispersive X-ray chemical microanalysis;
- Analysis of the distribution of chemical elements and area mapping of chemical composition on the basis of SEM images.

Equipment:
Scanning electron microscope JSM-5610 LV is equipped with system of chemical microanalysis EDX JED-2201 (JEOL, Japan), allowing to make the simultaneous automatic qualitative and quantitative chemical analysis up to 99 interesting sites of the image of the researched object.

Technical characteristics (JSM-5610 LV)

Scanning Electron Microscopy with Wave-Dispersion Chemical Analysis 

Directions of research:
- investigations of a microstructure of various materials: metals, alloys, glass, ceramics, semi-conductor materials;
- analysis of mechanical deterioration and destructions of materials;
- qualitative and quantitative chemical analysis with use of X-rays wave- dispersion spectral analysis;
- reception of maps and structures of distribution of elements in materials.

Transmission Electron Microscopy and Electron Diffraction

Directions of research:
- investigations of microstructure of thin-film materials in a mode of the high resolution;
- investigations of surface structure of materials with use of the replicas, which have been copied from a surface of volume materials;
- investigations of crystal structure by a method of electron diffraction with reception of circular and dot electronograms;